tangentGo - Analysis Program for Instrumented Indentation Testing
Copyright (c) 2019-2023 National Institute for Materials Science
Created by Kensuke Miyahara

tangentGo is an analysis program (software) for Instrumented Indentation Testing (IIT) including nanoindentation. Please see a video or PDF for details.
- Introduction [function-en.m4v] - function of tangentGo (2 min.) PDF version is here. [function-en.pdf]
- Operation (1) [demo-en.m4v] - demostration with attached sample setting (1 min.)
- Operation (2) [young-en.m4v] - analysis for Young's modulus (1 min.)
- Operation (3) [hvi-en.m4v] - HVI(IW) hardness analysis, such as Vickers Hardness (1 min.)
* If the video does not start, please right click to save it and play the donwloaded file.
Latest version (updated irregularly)

Important notice
- The source list of tangentGo has been released under MIT license. The official repository is here.
- The freeWrap (Tcl/Tk) which was used for Windows version until v0.41, is not included in tangentGo ZIP file any more. Please install freeWrap or other Tcl/Tk software by yourself.
- For Windows users, freeWrap is recommended.
- If you use freeWrap, download freewrapXXX.zip (XXX is a number) from freeWrap website and rename freewrap.exe as wish.exe, and store it in tangentGo folder or somewhere in your PATH.
- As for Tcl/Tk software other than freeWrap, please refer to official Tcl/Tk website, especially this page.
From Developer
- Operation on Windows or macOS is not fully tested since my system is Linux. Your feedback is highly appreciated.
- CH fitting is improved.(v0.42+)。
- This software is released under MIT License.(v0.50+)。
* Please extract all files in zip, and then exec run.bat (Windows), run.command (macOS), run.tcl (Linux), respectively. For macOS, additional setting is necessary. See readme.txt for details.
FAQ (Frequently Asked Questions)
- What is tangentGo?
- It is an analysis program for Instrumented Indentation Testing (IIT). You probably don't need this program if you don't use IIT.
- Why was tangentGo created?
- Commercial IIT testers provide their own analysis function. However, there are large variation, outliers, dependence on choice of standard specimens with these testers even if the same specimen is tested. This is NOT a problem of specific testers, but is a common problem among IIT testers. Therefore, tangentGo was created so that every users can try tangent depth analysis proposed by Prof. Emeritus Tatsuya ISHIBASHI at Niigata university.
- What is obtained by tangent depth analysis?
- In addition to Indentation modulus (Young's modulus) EIT, Indentation hardness HIT, Equivalent Indentation Vickers Hardness HVI(IW) can be obtained. HVI(IW) is shown as Heq (= Equivalent Hardness) in tangentGo.
- What is the advantage of tangent depth analysis?
- As shown in P. 16 of this PDF (in Japanese), if you use tangent depth analysis (tangentGo) instead of built-in function of IIT testers, the variation of 11 IIT testers is greatly improved from 26.5% to 4.8 %, ca. 1/5 (note that experimental data are the same). If outliers are excluded, the variation is also reduced from 10.1% to 2.1 %, ca. 1/5. You can expect more appropriate results with tangent depth analysis
- What is the detail of tangent depth analysis?
- Please see this PDF (in English) or P.7-11 in this PDF (in Japanese).
- Does it cost money?
- The tangentGo software is released under MIT license. You may use tangentGo for free (NO WARRANTY). Please give it a try with your own experimental data.
- Does tangentGo support ISO14577?
- No, tangent depth analysis (tangentGo) uses its own method based on hr (tangent depth) for better results. Please see Help -> ISO14577 for more detail. Though it is not ISO14577 comliant, you can choose hc (contact depth) instead of hr (tangent depth) at METHOD in the main window to compare difference of hc and hr (NOT recommended).
- I can't read experimental data files!
- Supported files are .csv, .tsv, .txt, and .xlsx only. Old .xls format is NOT supported. If a supported file can't be read properly, please contact the address shown in readme.txt with a sample file which can't be read.
- Is it possible to preset obtained calibration values such as CF or A(h)?
- You can set CF in CF box in the main window. Since there are no such function to preset other calibration values, please run with experimental data of standard specimens always.
- How can I update tangentGo?
- Download the updated zip and extract (and overwrite) all files in the zip to the old folder. Alternatively, you can start with a new folder with the updated zip.
- How can I uninstall tangentGo?
- Simply delete extracted files.
Presentation PDF (in Japanese & English)
- (2020/01/30) Calculation of Young’s modulus with the round robin data [Reference 5,6] (in Japanese)
- (2020/10/29) Verification of HVI(IW) hardness and Young's modulus and review on tangent depth analysis [Reference 8] Pages 7-9 in English (in Japanese)
- (2021/01/26) Review of tangentGo [Reference 10] (in Japanese)
- (2021/02/26) Reason why tangentGo is created and introduction of tangentGo [research workshop about hardness] (in Japanese)
- (2021/08/30-09/03 on demand) tangentGo-related topic and short review [IMEKO2021] (in English)
- (2022/01/27) tangentGo and related topic [research workshop about hardness] (in Japanese)
- T. ISHIBASHI, Y. YOSHIKAWA, K. MIYAHARA, T. YAMAMOTO, S. KATAYAMA, M. YAMAMOTO: J. Mater. Test. Res. Vol.61, No.2, 60 (2016)
- T. ISHIBASHI, Y. YOSHIKAWA, S. KATAYAMA, K. MIYAHARA, M. OHKI, T. YAMAMOTO, M. YAMAMOTO: J. Mater. Test. Res. Vol.62, No.2, 68 (2017)
- T. ISHIBASHI, Y. YOSHIKAWA, M. YAMAMOTO, K. MIYAHARA, T. YAMAMOTO, M. OHKI, S. KATAYAMA: J. Mater. Test. Res. Vol.62, No.3, 164 (2017)
- T. ISHIBASHI, Y. YOSHIKAWA, K. MIYAHARA, T. YAMAMOTO, S. TAKAGI, M. FUJITSUKA, S. KATAYAMA: J. Mater. Test. Res. Vol.65, No.1, 4 (2020)
- K. MIYAHARA, T. ISHIBASHI, Y. YOSHIKAWA, T. YAMAMOTO: J. Mater. Test. Res. Vol. 65, No. 1, 25 (2020) (in Japanese)
- K. MIYAHARA, T. ISHIBASHI, Y. YOSHIKAWA, T. YAMAMOTO: J. Mater. Test. Res. Vol. 65, No. 1, 32 (2020) (in Japanese)
- K. MIYAHARA, T. ISHIBASHI, Y. YOSHIKAWA, T. YAMAMOTO: J. Mater. Test. Res. Vol. 65, No. 2, 108 (2020) (in Japanese)
- T. ISHIBASHI, K. MIYAHARA, Y. YOSHIKAWA, T. YAMAMOTO, S. KATAYAMA: J. Mater. Test. Res. Vol.65, No.4, 197 (2020)
- T. ISHIBASHI, K. MIYAHARA, Y. YOSHIKAWA, T. YAMAMOTO, S. KATAYAMA: J. Mater. Test. Res. Vol.66, No.1, 16 (2021)
- K. MIYAHARA, T. ISHIBASHI, Y. YOSHIKAWA, T. YAMAMOTO: J. Mater. Test. Res. Vol. 66, No. 1, 27 (2021) (in Japanese)
- Kensuke Miyahara, Takashi Yamamoto: Measurement: Sensors, Volume 18, December 2021, 100254 (Open Access: You can download the PDF.)
Links
Journals